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HT2002L 数据表(PDF) 21 Page - HYES Optoelectronics, Inc. |
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HT2002L 数据表(HTML) 21 Page - HYES Optoelectronics, Inc. |
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21 / 23 page ![]() (4.0) Reliability Condition Item Content Room Temperature Operation 50,000 hrs (4.1) Reliability Test No. Item Condition Test Sample Note Time Numbers 1 High Temp 120 hrs 3 Operation 2 Low Temp 120 hrs 3 Operation 3 High Humidity 120 hrs Storage 4 Thermal Shock /6days (4.2) Criteria a. No changes for indication and appearance. b. Leave the all samples under roon temperature 4 hours after reliability test ends. -20 ± 2℃ 0/1 60℃ 0/1 3 Creteria (Acc/Rej) 70 ± 2℃ 0/1 LCM HT2002L Page 21 of 23 90%rh 100 cycles TECHNICAL SPECIFICATION Date : Dec. 13, 2007 ↔ 70℃ 3 0/1 30mn stage -20℃ |
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