TLC2202ACD datasheet(42/62 Pages) TI

42 / 62 page

TLC220x, TLC220xA, TLC220xB, TLC220xY

Advanced LinCMOS

™ LOW-NOISE PRECISION

OPERATIONAL AMPLIFIERS

SLOS175 – FEBRUARY 1997

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

PARAMETER MEASUREMENT INFORMATION

Figure 1. Noise-Voltage Test Circuit

2 k

Ω

VDD +

VDD – /GND

Ω

–

Figure 2. Phase-Margin Test Circuit

10 k

Ω

VDD +

VDD –

100

Ω

–

(see Note A)

NOTE A: CL includes fixture capacitance.

Figure 3. Slew-Rate Test Circuit

VDD +

VDD –

–

(see Note A)

NOTE A: CL includes fixture capacitance.

Figure 4. Input-Bias and Offset-Current Test Circuit

VDD +

VDD – /GND

–

Ground Shield

typical values

Typical values presented in this data sheet represent the median (50% point) of device parametric performance.

input bias and offset current

At the picoamp bias current level of the TLC220x, TLC220xA, and TLC220xB, accurate measurement of the

bias current becomes difficult. Not only does this measurement require a picoammeter, but test socket leakages

can easily exceed the actual device bias currents. To measure these small currents, Texas Instruments uses

a two-step process. The socket leakage is measured using picoammeters with bias voltages applied but with

no device in the socket. The device is then inserted in the socket, and a second test measuring both the socket

leakage and the device input bias current is performed. The two measurements are then subtracted

algebraically to determine the bias current of the device.

noise

Texas Instruments offers automated production noise testing to meet individual application requirements. Noise

voltage at f = 10 Hz and f = 1 kHz is 100% tested on every TLC2201B device, while lot sample testing is

performed on the TLC220xA. For other noise requirements, please contact the factory.

TLC2202ACD 数据表(PDF) 42 Page - Texas Instruments

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TLC2202ACD 数据表(PDF) 42 Page - Texas Instruments

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