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TLE2082IP 数据表(PDF) 40 Page - Texas Instruments

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部件名 TLE2082IP
功能描述  EXCALIBUR HIGH-SPEED JFET-INPUT OPERATIONAL AMPLIFIERS
PDF  69 Pages
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

TLE2082IP 数据表(HTML) 40 Page - Texas Instruments

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TLE208x, TLE208xA, TLE208xY
EXCALIBUR HIGH-SPEED JFET-INPUT
OPERATIONAL AMPLIFIERS
SLOS182A – FEBRUARY 1997 – REVISED MARCH 2000
40
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
+
2 k
2 k
RL
CL†
VO
VCC +
VCC +
VI
+
10 k
VO
CL†
100
RL
VCC +
VCC +
VI
† Includes fixture capacitance
† Includes fixture capacitance
Figure 1. Slew-Rate Test Circuit
Figure 2. Unity-Gain Bandwidth
and Phase-Margin Test Circuit
† Includes fixture capacitance
+
+
2 k
VCC +
VCC +
VO
VO
VCC –
VCC –
RS
RS
Ground Shield
Picoammeters
Figure 3. Noise-Voltage Test Circuit
Figure 4. Input-Bias and Offset-
Current Test Circuit
+
VCC +
VO
VCC –
IN –
IN +
Cic
Cic
Cid
Figure 5. Internal Input Capacitance
typical values
Typical values presented in this data sheet represent the median (50% point) of device parametric performance.
input bias and offset current
At the picoampere bias-current level typical of the TLE208x and TLE208xA, accurate measurement of the bias
becomes difficult. Not only does this measurement require a picoammeter, but test socket leakages can easily
exceed the actual device bias currents. To accurately measure these small currents, Texas Instruments uses
a two-step process. The socket leakage is measured using picoammeters with bias voltages applied but with
no device in the socket. The device is then inserted in the socket and a second test is performed that measures
both the socket leakage and the device input bias current. The two measurements are then subtracted
algebraically to determine the bias current of the device.



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