TLV2342, TLV2342Y, TLV2344, TLV2344Y

LinCMOS

™ LOW-VOLTAGE HIGH-SPEED

OPERATIONAL AMPLIFIERS

SLOS194 – FEBRUARY 1997

23

POST OFFICE BOX 655303

PARAMETER MEASUREMENT INFORMATION

single-supply versus split-supply test circuits

Because the TLV234x is optimized for single-supply operation, circuit configurations used for the various tests

often present some inconvenience since the input signal, in many cases, must be offset from ground. This

inconvenience can be avoided by testing the device with split supplies and the output load tied to the negative

rail. A comparison of single-supply versus split-supply test circuits is shown below. The use of either circuit gives

the same result.

–

+

–

+

VDD

VI

CL

RL

VO

VDD +

VDD –

VI

VO

CL

RL

(a) SINGLE SUPPLY

(b) SPLIT SUPPLY

Figure 35. Unity-Gain Amplifier

–

+

–

+

1/2 VDD

VDD

20

Ω

20

Ω

2 k

Ω

VDD –

VO

VO

20

Ω

20

Ω

(a) SINGLE SUPPLY

2 k

Ω

VDD +

(b) SPLIT SUPPLY

Figure 36. Noise-Test Circuit

–

+

–

+

10 k

Ω

1/2 VDD

100

Ω

VO

VDD

VI

VI

100

Ω

(a) SINGLE SUPPLY

(b) SPLIT SUPPLY

10 k

Ω

VDD +

VDD –

CL

CL

VO

Figure 37. Gain-of-100 Inverting Amplifier