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ASM3P622S00AG-08-SR 数据表(PDF) 5 Page - PulseCore Semiconductor

部件名 ASM3P622S00AG-08-SR
功能描述  Low Frequency Timing-Safe??Peak EMI reduction IC
PDF  16 Pages
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制造商  PULSECORE [PulseCore Semiconductor]
网页  http://www.onsemi.com/
标志 PULSECORE - PulseCore Semiconductor

ASM3P622S00AG-08-SR 数据表(HTML) 5 Page - PulseCore Semiconductor

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May 2007
ASM3P622S00A/B/J/E/K
rev 0.4
Low Frequency Timing-Safe™ Peak EMI Reduction IC
5 of 16
Notice: The information in this document is subject to change without notice.
Pin Description for ASM3P622S00K
Pin #
Pin Name
Description
1
XIN/CLKIN
Crystal connection or external reference frequency input. This pin has dual functions. It
can be connected either to an external crystal or an external reference clock.
2
XOUT
Crystal connection. If using an external reference, this pin must be left unconnected.
3
CLKOUT1
1
Buffered clock output
4
VDD
3.3V supply
5
SS%
2
Spread Spectrum Selection
6
GND
Ground
7
CLKOUT2
1
Buffered clock output
8
CLKOUT3
1
Buffered clock output
9
SSON
2
Spread Spectrum enable and disable option. When SSON is HIGH, the spread
spectrum is enabled and when LOW, it turns off the spread spectrum.
10
CLKOUT4
1
Buffered clock output
11
CLKOUT5
1
Buffered clock output
12
GND
Ground
13
VDD
3.3V supply
14
CLKOUT6
1
Buffered clock output
15
CLKOUT7
1
Buffered clock output
16
CLKOUT
1
Buffered clock output
Notes: 1. Weak pull-down on all outputs
2. Weak pull-up on these Inputs
3. Buffered clock outputs are Timing-Safe™
Spread Spectrum Control and Input-Output Skew Table
Device
Input Frequency
SS %
Deviation
Input-Output Skew(±TSKEW)
0
±0.25 %
0.063
ASM3P622S00A/B/J/E/K
12MHz
1
±0.50 %
0.125
Note: TSKEW is measured in units of the Clock Period
Absolute Maximum Ratings
Symbol
Parameter
Rating
Unit
VDD
Voltage on any pin with respect to Ground
-0.5 to +4.6
V
TSTG
Storage temperature
-65 to +125
°C
Ts
Max. Soldering Temperature (10 sec)
260
°C
TJ
Junction Temperature
150
°C
TDV
Static Discharge Voltage (As per JEDEC STD22- A114-B)
2
KV
Note: These are stress ratings only and are not implied for functional use. Exposure to absolute maximum ratings for prolonged periods of time may affect
device reliability.



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