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SPT7850

ELECTRICAL SPECIFICATIONS

TEST

TEST

SPT7850

PARAMETERS

CONDITIONS

LEVEL

MIN

TYP

MAX

UNITS

Resolution

10

Bits

DC Accuracy

Integral Linearity Error (ILE)

V

±1.0

LSB

Differential Linearity Error (DLE)

V

±0.5

LSB

No Missing Codes

VI

Guaranteed

Analog Input

Input Voltage Range

VI

V

Input Resistance

IV

50

k

Ω

Input Capacitance

V

5.0

pF

Input Bandwidth

(Small Signal)

V

100

MHz

Offset

V

±2.0

LSB

Gain Error

V

±2.0

LSB

Reference Input

Resistance

VI

400

500

600

Ω

Bandwidth

V

100

150

MHz

Voltage Range

IV

0

2.0

V

IV

3.0

V

V

1.0

4.0

5.0

V

90

mV

75

mV

Reference Settling Time

V

15

Clock Cycles

V

20

Clock Cycles

Conversion Characteristics

Maximum Conversion Rate

VI

20

MHz

Minimum Conversion Rate

V

50

kHz

Pipeline Delay (Latency)

IV

12

Clock Cycles

Aperture Delay Time

V

5

ns

Aperture Jitter Time

V

30

ps (p-p)

Dynamic Performance

Effective Number of Bits (ENOB)

VI

8.8

Bits

VI

8.5

Bits

Signal-to-Noise Ratio (SNR)

(without Harmonics)

VI

53

56

dB

VI

52

55

dB

1

SPT7850SCN is screened for DC accuracy tests at 100 kHz. SPT7850SIS and SPT7850SCT are screened for DC accuracy tests at 35 MHz.

Note: 1. Operation at any Absolute Maximum Rating is not implied. See

Electrical Specifications for proper nominal applied conditions

in typical applications.

Supply Voltages

Input Voltages

AGND – DGND .............................................. ±100 mV

Output

Digital Outputs ................................................... 10 mA

Temperature

Operating Temperature ............................ –40 to 85 °C

Junction Temperature ........................................ 175 °C

Lead Temperature, (soldering 10 seconds) ....... 300 °C

Storage Temperature ............................ –65 to +150 °C