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ADP3634ARDZ-RL 数据表(PDF) 6 Page - Analog Devices |
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ADP3634ARDZ-RL 数据表(HTML) 6 Page - Analog Devices |
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6 / 16 page ![]() ADP3623/ADP3624/ADP3625/ADP3633/ADP3634/ADP3635 Rev. A | Page 6 of 16 ABSOLUTE MAXIMUM RATINGS Table 2. Parameter Rating VDD −0.3 V to +20 V OUTA, OUTB DC −0.3 V to V DD + 0.3 V <200 ns −2 V to V DD + 0.3 V INA, INA, INB, −0.3 V to V DD + 0.3 V INB, and SD ESD Human Body Model (HBM) 3.5 kV Field Induced Charged Device Model (FICDM) SOIC_N_EP 1.5 kV MINI_SO_EP 1.0 kV θ JA, JEDEC 4-Layer Board SOIC_N_EP1 59°C/W MINI_SO_EP1 43°C/W Junction Temperature Range −40°C to +150°C Storage Temperature Range −65°C to +150°C Lead Temperature Soldering (10 sec) 300°C Vapor Phase (60 sec) 215°C Infrared (15 sec) 260°C 1 θ JA is measured per JEDEC standards, JESD51-2, JESD51-5, and JESD51-7, as appropriate with the exposed pad soldered to the PCB. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ESD CAUTION |
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