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SP48E,485E_00_2808

The Human Body Model has been the

generally accepted ESD testing method

for semiconductors. This method is also

specified in MIL-STD-883, Method 3015.7

for ESD testing. The premise of this ESD

test is to simulate the human body’s potential

to store electro-static energy and discharge

it to an integrated circuit. The simulation is

performed by using a test model as shown

in Figure 9. This method will test the IC’s

capability to withstand an ESD transient dur-

ing normal handling such as in manufactur-

ing areas where the ICs tend to be handled

frequently. The IEC-000-4-2, formerly

IEC801-2, is generally used for testing ESD

on equipment and systems.

For system manufacturers, they must guar-

antee a certain amount of ESD protection

since the system itself is exposed to the

outside environment and human presence.

The premise with IEC1000-4-2 is that the

system is required to withstand an amount

of static electricity when ESD is applied to

points and surfaces of the equipment that

are accessible to personnel during normal

usage. The transceiver IC receives most

of the ESD current when the ESD source is

applied to the connector pins. The test cir-

cuit for IEC1000-4-2 is shown on Figure 10.

There are two methods within IEC1000-4-2,

the Air Discharge method and the Contact

Discharge method.

Device

Under

Test

DC Power

Source

SW1

SW2

RS and RV add up to 330Ω for IEC1000-4-2.

Device

Under

Test

DC Power

Source

SW1

SW2

Contact-Discharge Model

Figure 9. ESD Test Circuit for Human Body Model

Figure 10. ESD Test Circuit for IEC1000-4-2