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BQ20Z40-R1 数据表(PDF) 5 Page - Texas Instruments |
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BQ20Z40-R1 数据表(HTML) 5 Page - Texas Instruments |
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5 / 16 page ![]() 1.76 1.77 1.78 1.79 1.8 1.81 -40 -20 0 20 40 60 80 T -Free-AirTemperature-°C A POWERONRESETBEHAVIOR FREE-AIRTEMPERATURE VS bq20z40-R1 www.ti.com SLUS993 – DECEMBER 2009 INTEGRATING ADC (Coulomb Counter) CHARACTERISTICS VCC = 2.4V to 2.6 V, TA = –40°C to 85°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT V(SR) Input voltage range, V(SRN) and V(SRP) V(SR) = V(SRN) – V(SRP) –0.2 0.2 V V(SROS) Input offset 10 μV INL Integral nonlinearity error 0.007% 0.034% OSCILLATOR VCC = 2.4 V to 2.6 V, TA = –40°C to 85°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT HIGH FREQUENCY OSCILLATOR f(OSC) Operating Frequency 4.194 MHz –3% 0.25% 3% f(EIO) Frequency Error (1) (2) TA = 20°C to 70°C –2% 0.25% 2% t(SXO) Start-up Time (3) 2.5 5 ms LOW FREQUENCY OSCILLATOR f(LOSC) Operating Frequency 32.768 KHz –2.5% 0.25% 2.5% f(LEIO) Frequency Error (2) (4) TA = 20°C to 70°C –1.5% 0.25% 1.5% t(LSXO) Start-up time (5) 500 μs (1) The frequency error is measured from 4.194 MHz. (2) The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C. (3) The start-up time is defined as the time it takes for the oscillator output frequency to be within 1 % of the specified frequency. (4) The frequency error is measured from 32.768 kHz. (5) The start-up time is defined as the time it takes for the oscillator output frequency to be ± 3%. DATA FLASH MEMORY CHARACTERISTICS VCC = 2.4 V to 2.6 V, TA = –40°C to 85°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tDR Data retention See (1) 10 Years (1) Specified by design. Not production tested. Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Link(s) :bq20z40-R1 |
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