LED Display

SMB 1.1

JEITA and

Enhanced

Charging

Algorithm

Data Flash

Memory

SHA-1

Authentication

Fuse Blow

Detection & Logic

System Control

Over

Temperature

Protection

Temperature

Measurement

Oscillator

Over & Under

Voltage

Protection

Over Current

Protection

PreCharge FET

& GPOD Drive

Impedance

Track™ Gas

Gauging

Voltage

Measurement

Coulomb

Counter

N Channel FET

Drive

AFE HW Control

HW Over

Current & Short

Circuit Protection

Power Mode

Control

Watchdog

Cell Balancing

Cell Voltage

Multiplexer

Regulators

SMBD

SMBC

DISP

RBI

MSRT

RESET

ALERT

VCELL+

VC1

VC2

VC3

VC4

VC5

REG33

REG25

VC1

VC4

VDD

VC2

CD

GND

OUT

VC3

+

+

+

+

PACK+

PACK-

RSNS

5mΩ - 20m Ω typ

bq20z65-R1

bq294xx

bq20z65-R1

SLUS990 – DECEMBER 2009

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

SYSTEM PARTITIONING DIAGRAM

PACKAGE THERMAL DATA

Table 2.

DERATING FACTOR

DEVICE

PACKAGE

POWER RATING

POWER RATING

POWER RATING

bq20z65-R1

TSSOP-44

47.6°C/W

2101mW

21.01mw/°C

1155mW

840mW

2

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Product Folder Link(s): bq20z65-R1