数据搜索系统，热门电子元器件搜索
  Chinese  ▼
ALLDATASHEETCN.COM

X  

预览 PDF HTML

LA112B-SRF.DBK-R1-PF 数据表(PDF) 7 Page - LIGITEK electronics co., ltd.

部件名 LA112B-SRF.DBK-R1-PF
功能描述  LED ARRAY
PDF  7 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  LIGITEK [LIGITEK electronics co., ltd.]
网页  http://www.ligitek.com
标志 LIGITEK - LIGITEK electronics co., ltd.

LA112B-SRF.DBK-R1-PF 数据表(HTML) 7 Page - LIGITEK electronics co., ltd.

  LA112B-SRF.DBK-R1-PF Datasheet HTML 1Page - LIGITEK electronics co., ltd. LA112B-SRF.DBK-R1-PF Datasheet HTML 2Page - LIGITEK electronics co., ltd. LA112B-SRF.DBK-R1-PF Datasheet HTML 3Page - LIGITEK electronics co., ltd. LA112B-SRF.DBK-R1-PF Datasheet HTML 4Page - LIGITEK electronics co., ltd. LA112B-SRF.DBK-R1-PF Datasheet HTML 5Page - LIGITEK electronics co., ltd. LA112B-SRF.DBK-R1-PF Datasheet HTML 6Page - LIGITEK electronics co., ltd. LA112B-SRF.DBK-R1-PF Datasheet HTML 7Page - LIGITEK electronics co., ltd.  
Zoom Inzoom in Zoom Outzoom out
 7 / 7 page
background image
Page 6/6
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Description
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
Reference
Standard
Test Condition
Test Item
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
Operating Life Test
Reliability Test:
JIS C 7021: B-12
The purpose of this test is the resistance
of the device under tropical for hours.
MIL-STD-202:103B
JIS C 7021: B-11
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
This test intended to see soldering well
performed or not.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
Low Temperature
Storage Test
1.Ta=65
℃±5℃
2.RH=90 %~95%
3.t=240hrs
±2hrs
Thermal Shock Test
High Temperature
High Humidity Test
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
Solder Resistance
Test
1.T.Sol=230
℃±5℃
2.Dwell time=5
±1sec
Solderability Test
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
High Temperature
Storage Test
MIL-STD-883:1008
JIS C 7021: B-10
PART NO. LA112B/SRF.DBK-R1-PF



Html Pages

1 2 3 4 5 6 7


数据表 下载

Go To PDF Page


链接网址



ALLDATASHEET是否为您带来帮助?  [ DONATE ] 

关于 Alldatasheet   |   广告服务   |   联系我们   |   隐私政策   |   数据表链接    |   链接交换   |   制造商名单
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com