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LA55141 数据表(PDF) 5 Page - LIGITEK electronics co., ltd.

部件名 LA55141
功能描述  RECTANGLE TYPE LED LAMPS
PDF  5 Pages
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制造商  LIGITEK [LIGITEK electronics co., ltd.]
网页  http://www.ligitek.com
标志 LIGITEK - LIGITEK electronics co., ltd.

LA55141 数据表(HTML) 5 Page - LIGITEK electronics co., ltd.

  LA55141 Datasheet HTML 1Page - LIGITEK electronics co., ltd. LA55141 Datasheet HTML 2Page - LIGITEK electronics co., ltd. LA55141 Datasheet HTML 3Page - LIGITEK electronics co., ltd. LA55141 Datasheet HTML 4Page - LIGITEK electronics co., ltd. LA55141 Datasheet HTML 5Page - LIGITEK electronics co., ltd.  
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1.Ta=65
℃±5℃
2.RH=90 %~95%
3.t=240hrs
±2hrs
High Temperature
High Humidity Test
The purpose of this test is the resistance
of the device under tropical for hous.
MIL-STD-202:103B
JIS C 7021: B-11
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
1.T.Sol=230
℃±5℃
2.Dwell time=5
±1sec
Solderability Test
This test intended to see soldering well
performed or not.
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
Solder Resistance
Test
Thermal Shock Test
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
Reliability Test:
MIL-STD-883:1008
JIS C 7021: B-10
JIS C 7021: B-12
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
This test is conducted for the purpose
of detemining the resisance of a part
in electrical and themal stressed.
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
Low Temperature
Storage Test
High Temperature
Storage Test
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
The purpose of this is the resistance of
the device which is laid under ondition
of high temperature for hours.
Test Condition
Test Item
Operating Life Test
Description
Reference
Standard
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LA55141
Page 4/4



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