数据搜索系统，热门电子元器件搜索
  Chinese  ▼
ALLDATASHEETCN.COM

X  

预览 PDF HTML

LEG5262-R1-PF 数据表(PDF) 7 Page - LIGITEK electronics co., ltd.

部件名 LEG5262-R1-PF
功能描述  BIPOLAR TYPE LED LAMPS
PDF  7 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  LIGITEK [LIGITEK electronics co., ltd.]
网页  http://www.ligitek.com
标志 LIGITEK - LIGITEK electronics co., ltd.

LEG5262-R1-PF 数据表(HTML) 7 Page - LIGITEK electronics co., ltd.

  LEG5262-R1-PF Datasheet HTML 1Page - LIGITEK electronics co., ltd. LEG5262-R1-PF Datasheet HTML 2Page - LIGITEK electronics co., ltd. LEG5262-R1-PF Datasheet HTML 3Page - LIGITEK electronics co., ltd. LEG5262-R1-PF Datasheet HTML 4Page - LIGITEK electronics co., ltd. LEG5262-R1-PF Datasheet HTML 5Page - LIGITEK electronics co., ltd. LEG5262-R1-PF Datasheet HTML 6Page - LIGITEK electronics co., ltd. LEG5262-R1-PF Datasheet HTML 7Page - LIGITEK electronics co., ltd.  
Zoom Inzoom in Zoom Outzoom out
 7 / 7 page
background image
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Reference
Standard
Description
MIL-STD-883:1008
JIS C 7021: B-10
JIS C 7021: B-12
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
Page 6/6
Reliability Test:
Test Item
High Temperature
Storage Test
Low Temperature
Storage Test
Operating Life Test
Test Condition
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
MIL-STD-202:103B
JIS C 7021: B-11
The purpose of this test is the resistance
of the device under tropical for hours.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
This test intended to see soldering well
performed or not.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
High Temperature
High Humidity Test
Solder Resistance
Test
Thermal Shock Test
Solderability Test
1.Ta=65
℃±5℃
2.RH=90 %~95%
3.t=240hrs
±2hrs
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
1.T.Sol=230
℃±5℃
2.Dwell time=5
±1sec
LEG5262/R1-PF
PART NO.



Html Pages

1 2 3 4 5 6 7


数据表 下载

Go To PDF Page


链接网址



ALLDATASHEET是否为您带来帮助?  [ DONATE ] 

关于 Alldatasheet   |   广告服务   |   联系我们   |   隐私政策   |   数据表链接    |   链接交换   |   制造商名单
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com