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LSRG2093-R17-AS-H-PF 数据表(PDF) 7 Page - LIGITEK electronics co., ltd.

部件名 LSRG2093-R17-AS-H-PF
功能描述  DUAL COLOR LED LAMPS
PDF  7 Pages
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制造商  LIGITEK [LIGITEK electronics co., ltd.]
网页  http://www.ligitek.com
标志 LIGITEK - LIGITEK electronics co., ltd.

LSRG2093-R17-AS-H-PF 数据表(HTML) 7 Page - LIGITEK electronics co., ltd.

  LSRG2093-R17-AS-H-PF Datasheet HTML 1Page - LIGITEK electronics co., ltd. LSRG2093-R17-AS-H-PF Datasheet HTML 2Page - LIGITEK electronics co., ltd. LSRG2093-R17-AS-H-PF Datasheet HTML 3Page - LIGITEK electronics co., ltd. LSRG2093-R17-AS-H-PF Datasheet HTML 4Page - LIGITEK electronics co., ltd. LSRG2093-R17-AS-H-PF Datasheet HTML 5Page - LIGITEK electronics co., ltd. LSRG2093-R17-AS-H-PF Datasheet HTML 6Page - LIGITEK electronics co., ltd. LSRG2093-R17-AS-H-PF Datasheet HTML 7Page - LIGITEK electronics co., ltd.  
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LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Reference
Standard
Description
MIL-STD-883:1008
JIS C 7021: B-10
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
Test Condition
Test Item
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
Operating Life Test
High Temperature
Storage Test
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
Reliability Test:
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
JIS C 7021: B-12
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
The purpose of this test is the resistance
of the device under tropical for hours.
MIL-STD-202:103B
JIS C 7021: B-11
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
This test intended to see soldering well
performed or not.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
Low Temperature
Storage Test
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
Thermal Shock Test
1.Ta=65
℃±5℃
2.RH=90 %~95%
3.t=240hrs
±2hrs
High Temperature
High Humidity Test
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
Solder Resistance
Test
1.T.Sol=230
℃±5℃
2.Dwell time=5
±1sec
Solderability Test
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
LSRG2093/R17-AS/H-PF
PART NO.



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