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LSRG3392-R6-PF 数据表(PDF) 7 Page - LIGITEK electronics co., ltd.

部件名 LSRG3392-R6-PF
功能描述  DURL COLOR LED LAMPS
PDF  7 Pages
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制造商  LIGITEK [LIGITEK electronics co., ltd.]
网页  http://www.ligitek.com
标志 LIGITEK - LIGITEK electronics co., ltd.

LSRG3392-R6-PF 数据表(HTML) 7 Page - LIGITEK electronics co., ltd.

  LSRG3392-R6-PF Datasheet HTML 1Page - LIGITEK electronics co., ltd. LSRG3392-R6-PF Datasheet HTML 2Page - LIGITEK electronics co., ltd. LSRG3392-R6-PF Datasheet HTML 3Page - LIGITEK electronics co., ltd. LSRG3392-R6-PF Datasheet HTML 4Page - LIGITEK electronics co., ltd. LSRG3392-R6-PF Datasheet HTML 5Page - LIGITEK electronics co., ltd. LSRG3392-R6-PF Datasheet HTML 6Page - LIGITEK electronics co., ltd. LSRG3392-R6-PF Datasheet HTML 7Page - LIGITEK electronics co., ltd.  
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This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
Solderability Test
1.T.Sol=230
℃±5℃
2.Dwell time=5
±1sec
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
This test intended to see soldering well
performed or not.
Low Temperature
Storage Test
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
Thermal Shock Test
Solder Resistance
Test
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
High Temperature
High Humidity Test
1.Ta=65
℃±5℃
2.RH=90 %~95%
3.t=240hrs
±2hrs
High Temperature
Storage Test
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
Test Item
Operating Life Test
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
Test Condition
Reliability Test:
JIS C 7021: B-12
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202:103B
JIS C 7021: B-11
The purpose of this test is the resistance
of the device under tropical for hours.
MIL-STD-883:1008
JIS C 7021: B-10
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
Reference
Standard
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
Description
Page 6/6
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LSRG3392/R6-PF



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