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SW2022R82K2 数据表(PDF) 7 Page - ABC Taiwan Electronics Corp |
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SW2022R82K2 数据表(HTML) 7 Page - ABC Taiwan Electronics Corp |
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7 / 8 page ![]() Temp.:50±2℃ Humidity test appearance. Note: Inductors are to be tested after 1 hour at room temperature. R.H.:90~95 % Time.:96±2 hours +125 for 30 minutes. ℃ -40 for 30 minutes. ℃ Time.:48±2 hours Temp.:125±2℃ Time.:48±2 hours Total:10 cycles Temp.:-40±2℃ 1.Temp:85±2℃ 1.Temp:40±2℃ 2.R.H.:90-95% 2.Time:1000±12 hours 3.Time:1000±12 hours 4. Load:Allowed DC current 3.Load:Allowed DC current AR-001A Humidity load life High temperature storage load life High tempera - ture test storage Thermal shock test Low temperature shorted or open winding. Inductors shall not have a 3.Q shall not change 2.Inductance shall not change more than±10% more than ±5% ABC'S DWG NO. ABC'S ITEM NO. attachment. SPECIFICATION FOR APPROVAL force indicated at left without a failure device must withstand the minimum the side of the component . The copper substrate. A dynometer force gauge shall be applied to (230±5 for 10 seconds) to a tinned ℃ The device shall be reflow soldered of the termination to board -40 ~125 ℃℃ PROD. WOUND CHIP INDUCTOR Temperature characteristic NAME adhesion (Push test) Component deformation or change in 1.There shall be no case 20N:2012,2520,3225 10N:1608 5N:1005 REF : SW2022□□□□2□-□□□ PAGE: 7 |
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