Production Data

WM2610

WOLFSON MICROELECTRONICS LTD

PD Rev 1.0 February 2001

3

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at

or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified.

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible to

damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of

this device.

CONDITION

MIN

MAX

Digital supply voltages, AVDD or DVDD to GND

7V

Reference voltage

-0.3V

AVDD + 0.3V

Digital input voltage range to GND

-0.3V

DVDD + 0.3V

WM2610CDT

WM2610IDT

0

°C

-40

°C

70

°C

85

°C

Storage temperature

-65

°C

150

°C

Soldering temperature, 1.6mm (1/16 inch) from package body for 10

seconds

260

°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

AVDD,

DVDD

2.7

5.5

V

High-level digital input voltage

2V

Low-level digital input voltage

0.8

V

AVDD = 5V

GND

4.096

AVDD

Reference voltage to REF

AVDD = 3V

GND

2.048

AVDD

V

Output Load Resistance

2k

Ω

Load capacitance

100

pF

WM2610CDT

0

70

°C

Operating free-air temperature

WM2610IDT

-40

85

°C