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74LVC595AD 数据表(PDF) 13 Page - NXP Semiconductors |
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74LVC595AD 数据表(HTML) 13 Page - NXP Semiconductors |
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13 / 19 page ![]() 74LVC595A_1 © NXP B.V. 2007. All rights reserved. Product data sheet Rev. 01 — 29 May 2007 13 of 19 NXP Semiconductors 74LVC595A 8-bit serial-in/serial-out or parallel-out shift register; 3-state Test data is given in Table 9. Definitions for test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. VEXT = External voltage for measuring switching times. Fig 13. Load circuitry for switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aae331 VEXT VCC VI VO DUT CL RT RL RL PULSE GENERATOR Table 9. Test data Supply voltage Input Load VEXT VI tr, tf CL RL tPLH, tPHL tPLZ, tPZL tPHZ, tPZH 1.2 V VCC ≤ 2 ns 30 pF 1 k Ω open 2 × VCC GND 1.65 V to 1.95 V VCC ≤ 2 ns 30 pF 1 k Ω open 2 × VCC GND 2.3 V to 2.7 V VCC ≤ 2 ns 30 pF 500 Ω open 2 × VCC GND 2.7 V 2.7 V ≤ 2.5 ns 50 pF 500 Ω open 2 × VCC GND 3.0 V to 3.6 V 2.7 V ≤ 2.5 ns 50 pF 500 Ω open 2 × VCC GND |
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