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PCF8564AU/5BB/1 数据表(PDF) 29 Page - NXP Semiconductors |
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PCF8564AU/5BB/1 数据表(HTML) 29 Page - NXP Semiconductors |
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29 / 44 page ![]() PCF8564A_1 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 1 — 8 October 2009 29 of 44 NXP Semiconductors PCF8564A Real time clock and calendar 14. Dynamic characteristics [1] Integrated load capacitance, CL(itg), is a calculation of COSCI and COSCO in series: . [2] Unspecified for fCLKOUT = 32.768 kHz. [3] All timing values are valid within the operating supply voltage at ambient temperature and referenced to VIL and VIH with an input voltage swing of VSS to VDD. [4] A detailed description of the I2C-bus specification is given in Ref. 11 “UM10204”. Table 30. Dynamic characteristics VDD = 1.8 V to 5.5 V; VSS =0V; Tamb = −40 °C to +85 °C; fosc = 32.768 kHz; quartz Rs =40kΩ; CL = 8 pF; unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit Oscillator CL(itg) integrated load capacitance [1] 6 8 10 pF ∆fosc/fosc relative oscillator frequency variation ∆V DD = 200 mV; Tamb =25 °C - 0.2 - ppm Quartz crystal parameters Rs series resistance - - 100 k Ω CL load capacitance - 8 - pF CLKOUT output δCLKOUT duty cycle on pin CLKOUT [2] -50 - % I2C-bus timing characteristics (see Figure 25)[3][4] fSCL SCL clock frequency - - 400 kHz tHD;STA hold time (repeated) START condition 0.6 - - µs tSU;STA set-up time for a repeated START condition 0.6 - - µs tLOW LOW period of the SCL clock 1.3 - - µs tHIGH HIGH period of the SCL clock 0.6 - - µs tr rise time of both SDA and SCL signals - - 0.3 µs tf fall time of both SDA and SCL signals - - 0.3 µs Cb capacitive load for each bus line - - 400 pF tSU;DAT data set-up time 100 - - ns tHD;DAT data hold time 0 - - ns tSU;STO set-up time for STOP condition 0.6 - - µs tw(spike) spike pulse width - - 50 ns C Litg () C OSCI C OSCO ⋅ () C OSCI C OSCO + () -------------------------------------------- = |
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