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TSH511 数据表(PDF) 7 Page - STMicroelectronics

部件名 TSH511
功能描述  Hi-fi stereo/mono infrared receiver and stereo sub-carrier demodulator
PDF  25 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

TSH511 数据表(HTML) 7 Page - STMicroelectronics

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TSH511
Electrical characteristics
7/25
ZAMP_IN
Input impedance defined as
RAMP_IN in parallel with CAMP_IN
RAMP_IN
CAMP_IN
10
2
k
Ω
pF
ZAMP_OUT Output impedance
350
Ω
P1dBAMP
1dB compression point
ZL = 2kΩ
ZL = 2kΩ
fcarrier= 2.8MHz
560
250
mVRMS
BWAMP
-3dB AMP bandwidth
ZL = 2kΩ
11
MHz
Limiter (LIM) section
GLIM
Voltage gain
ZL= 15kΩ tied to GND
50
54
60
dB
ZLIM_IN
Input impedance defined as
RLIM_IN in parallel with CLIM_IN
RLIM_IN
CLIM_IN
15
2
k
Ω
pF
VLIM_OUT
Output voltage
ZL = 15kΩ tied to GND
170
mVpp
FM demodulator section
VDEM
Output voltage
+-75kHz FM deviation
typical application
schematic, ZL = 4kΩ
700
800
900
mVRMS
ZDEM_OUT Output impedance
100
Ω
Squelch section
ATT
Audio attenuation on each receiver
when audio buffers are muted.
RX1 and RX2 audio buffers
muted, ZL = 16Ω on both
audio buffers
55
65
dB
ZN_IN
Noise amplifier input impedance
2
k
Ω
VN_TH
Comparator threshold
from muted to unmuted
state
Rmute = 22kΩ, fIN = 100kHz
9mVRMS
VN_HYS
Comparator hysteresis
Rmute = 22kΩ, fIN = 100kHz
1
mVRMS
Imute_sink
Current sinks on pin 25 to discharge
Cmute capacitor: ramp generator
controlling the attenuation from ON
to OFF states of audio buffers.
Voltage on pin 25 = 1.7V
24
µA
Imute_source
Current sources on pin 25 to charge
Cmute capacitor: ramp generator
controlling the attenuation from OFF
to ON states of audio buffers.
Voltage on pin 25 = 1.7V
14
µA
Audio buffers
ZOD-IN
Input impedance
200
k
Ω
BW1dB
-1dB bandwidth
ZL = 16Ω
35
kHz
POUT_OD
Output power
ZL= 16Ω, VOD_IN=70mVRMS
15
20
mW
THDOD
Distortion in line driver mode
Vout = 0.5 VRMS, ZL= 10kΩ
0.2
0.3
%
Table 4.
VCC = 2.7V, Tamb = 25°C, faudio = 1kHz, fcarrier = 2.8MHz, frequency deviation = +/-75kHz
(unless otherwise specified) (continued)
Symbol
Parameter
Test conditions
Min
Typ
Max
Unit



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