TAS5611A

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SLAS709 – JUNE 2010

<15ms/mF. While the PPSC detection is in progress, SD is kept low, and the device will not react to changes

applied to the RESET pins. If no shorts are present the PPSC detection passes, and SD is released. A device

reset will not start a new PPSC detection. PPSC detection is enabled in BTL and PBTL output configurations, the

detection is not performed in SE mode. To make sure the PPSC detection system is not tripped, it is

recommended not to insert resistive load to GND_X or PVDD_X.

OVERTEMPERATURE PROTECTION

The two different package options has individual overtemperature protection schemes.

PHD Package:

The TAS5611A PHD package option has a three-level temperature-protection system that asserts an active low

warning signal (OTW1) when the device junction temperature exceeds 100°C (typical), (OTW2) when the device

junction temperature exceeds 125°C (typical) and, if the device junction temperature exceeds 155°C (typical), the

device is put into thermal shutdown, resulting in all half-bridge outputs being set in the high-impedance (Hi-Z)

state and SD being asserted low. OTE is latched in this case. To clear the OTE latch, RESET must be asserted.

Thereafter, the device resumes normal operation.

DKD Package:

The TAS5611A DKD package option has a two-level temperature-protection system that asserts an active low

warning signal (OTW) when the device junction temperature exceeds 125°C (typical) and, if the device junction

temperature exceeds 155°C (typical), the device is put into thermal shutdown, resulting in all half-bridge outputs

being set in the high-impedance (Hi-Z) state and SD being asserted low. OTE is latched in this case. To clear the

OTE latch, RESET must be asserted. Thereafter, the device resumes normal operation.

UNDERVOLTAGE PROTECTION (UVP) AND POWER-ON RESET (POR)

The UVP and POR circuits of the TAS5611A fully protect the device in any power-up/down and brownout

situation. While powering up, the POR circuit resets the overload circuit (OLP) and ensures that all circuits are

fully operational when the GVDD_X and VDD supply voltages reach stated in the Electrical Characteristics table.

Although GVDD_X and VDD are independently monitored, a supply voltage drop below the UVP threshold on

any VDD or GVDD_X pin results in all half-bridge outputs immediately being set in the high-impedance (Hi-Z)

state and SD being asserted low. The device automatically resumes operation when all supply voltages have

increased above the UVP threshold.

DEVICE RESET

When RESET is asserted low, all power-stage FETs in the four half-bridges are forced into a high-impedance

(Hi-Z) state.

In BTL modes, to accommodate bootstrap charging prior to switching start, asserting the reset input low enables

weak pulldown of the half-bridge outputs. In the SE mode, the output is forced into a high impedance state when

asserting the reset input low. Asserting reset input low removes any fault information to be signaled on the SD

output, i.e., SD is forced high. A rising-edge transition on reset input allows the device to resume operation after

an overload fault. To ensure thermal reliability, the rising edge of reset must occur no sooner than 4 ms after the

falling edge of SD.

SYSTEM DESIGN CONSIDERATION

A rising-edge transition on reset input allows the device to execute the startup sequence and starts switching.

Apply only audio when the state of READY is high that will start and stop the amplifier without having audible

artifacts that is heard in the output transducers. If an overcurrent protection event is introduced the READY signal

goes low, hence, filtering is needed if the signal is intended for audio muting in non microcontroller systems.

The CLIP signal is indicating that the output is approaching clipping. The signal can be used to either an audio

volume decrease or intelligent power supply controlling a low and a high rail.

The device is inverting the audio signal from input to output.

The VREG pin is not recommended to be used as a voltage source for external circuitry.

Copyright © 2010, Texas Instruments Incorporated

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