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AM1806 数据表(PDF) 64 Page - Texas Instruments |
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AM1806 数据表(HTML) 64 Page - Texas Instruments |
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64 / 243 page ![]() TransmissionLine 4.0pF 1.85pF Z0=50 Ω (seenote) Tester PinElectronics Data SheetTimingReferencePoint Output Under Test 42 Ω 3.5nH DevicePin (seenote) Vref AM1806 SPRS658B – FEBRUARY 2010 – REVISED MAY 2010 www.ti.com 6 Peripheral Information and Electrical Specifications 6.1 Parameter Information 6.1.1 Parameter Information Device-Specific Information A. The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its transmission line effects must be taken into account. A transmission line with a delay of 2 ns or longer can be used to produce the desired transmission line effect. The transmission line is intended as a load only. It is not necessary to add or subtract the transmission line delay (2 ns or longer) from the data sheet timings. Input requirements in this data sheet are tested with an input slew rate of < 4 Volts per nanosecond (4 V/ns) at the device pin and the input signals are driven between 0V and the appropriate IO supply rail for the signal. Figure 6-1. Test Load Circuit for AC Timing Measurements The load capacitance value stated is only for characterization and measurement of AC timing signals. This load capacitance value does not indicate the maximum load the device is capable of driving. 6.1.1.1 Signal Transition Levels All input and output timing parameters are referenced to Vref for both "0" and "1" logic levels. For 3.3 V I/O, Vref = 1.65 V. For 1.8 V I/O, Vref = 0.9 V. Figure 6-2. Input and Output Voltage Reference Levels for AC Timing Measurements All rise and fall transition timing parameters are referenced to VIL MAX and VIH MIN for input clocks, VOLMAX and VOH MIN for output clocks Figure 6-3. Rise and Fall Transition Time Voltage Reference Levels 64 Peripheral Information and Electrical Specifications Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Link(s): AM1806 |
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