AnaSem Inc.

1

Rev. C09-09

产品规格书

AnaSem

安纳森半导体

.......... Future of the analog world

低电压

, 低功耗, ±1% 高精度电压检测内置延迟电路 CMOS 电压检测器

VDD 系列

概述

VDD系列乃用于低电压范围的低功耗，高检测精度的内置延迟电路电压

检测器

. VDD系列达成的检测精度是以集成电路内以温度系数调整的高准

确率参考电压值来作基准。本集成电路采用最新的

CMOS生产技术和激

光微调技术，与精锐的生产监控。因为内置有延迟电路，延迟检测时间

不需配合外围元件便可以原厂设定之延迟时间范围来选择。

特点

检测电压范围

··································································

工作电压范围

··································································

高精度电压检测

·····················································

电压检测温度特征

··································································

延迟时间选择

·························································································

输出类别

·························································································

低功耗

··································································

工作温度范围

··································································

小型封装

·························································································

应用范围

微型处理器的从设程序

各类系统的开动从设

电池充电检测

各类系统备用电源，电池开关控制

电池寿命检测

延迟电路设计

无卤素

RoHS

符合标准

1.8V~6.0V (selectable with a step of 0.1V)

0.7V~6.0V

S/10~50ms, M/50~200ms, L/80~400ms

CMOS or N-channel open drain

–40°C ~ +85°C

SOT-23 (400mW), SON-4 (400mW)