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LIS331DLHTR 数据表(PDF) 9 Page - STMicroelectronics |
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LIS331DLHTR 数据表(HTML) 9 Page - STMicroelectronics |
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9 / 38 page ![]() LIS331DLH Mechanical and electrical specifications Doc ID 15094 Rev 3 9/38 2 Mechanical and electrical specifications 2.1 Mechanical characteristics Table 3. Mechanical characteristics @ Vdd = 2.5 V, T = 25 °C unless otherwise noted (1) Symbol Parameter Test conditions Min. Typ.(2) Max. Unit FS Measurement range(3) FS bit set to 00 ±2.0 g FS bit set to 01 ±4.0 FS bit set to 11 ±8.0 So Sensitivity FS bit set to 00 12 bit representation 0.911.1 m g/digit FS bit set to 01 12 bit representation 1.822.2 FS bit set to 11 12 bit representation 3.5 3.9 4.3 TCSo Sensitivity change vs temperature FS bit set to 00 ±0.01 %/°C TyOff Typical zero- g level offset accuracy(4),(5) FS bit set to 00 ±20 m g TCOff Zero- g level change vs temperature Max delta from 25 °C ±0.1 m g/°C An Acceleration noise density FS bit set to 00 218 µ g/ Vst Self-test output change(6),(7),(8) FS bit set to 00 X axis 120 300 550 LSb FS bit set to 00 Y axis 120 300 550 LSb FS bit set to 00 Z axis 140 350 750 LSb Top Operating temperature range -40 +85 °C Wh Product weight 20 mgram 1. The product is factory calibrated at 2.5 V. The operational power supply range is from 2.16 V to 3.6 V. 2. Typical specifications are not guaranteed 3. Verified by wafer level test and measurement of initial offset and sensitivity 4. Typical zero- g level offset value after MSL3 preconditioning 5. Offset can be eliminated by enabling the built-in high pass filter 6. The sign of “Self-test output change” is defined by CTRL_REG4 STsign bit ( Table 28), for all axes. 7. Self-test output changes with the power supply. “Self-test output change” is defined as OUTPUT[LSb](CTRL_REG4 ST bit=1) - OUTPUT[LSb](CTRL_REG4 ST bit=0). 1LSb=4g/4096 at 12bit representation, ±2 g Full-scale 8. Output data reach 99% of final value after 1/ODR+ 1 ms when enabling self-test mode, due to device filtering Hz |
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