CLC1011ISC5X datasheet(11/17 Pages) CADEKA

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Data Sheet

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Input

Output

Figure 6. Addition of RS for Driving Capacitive Loads

Table 1 provides the recommended RS for various capacitive

loads. The recommended RS values result in approximately

<1dB peaking in the frequency response. The Frequency

Response vs. CL plot, on page 6, illustrates the response

of the CLCx011.

CL (pF)

RS (Ω)

-3dB BW (kHz)

10pF

2.2

20pF

2.4

50pF

2.5

100pF

100

Table 1: Recommended RS vs. CL

For a given load capacitance, adjust RS to optimize the

tradeoff between settling time and bandwidth. In general,

reducing RS will increase bandwidth at the expense of

additional overshoot and ringing.

Overdrive Recovery

An overdrive condition is defined as the point when either

one of the inputs or the output exceed their specified

voltage range. Overdrive recovery is the time needed for

the amplifier to return to its normal or linear operating

point. The recovery time varies, based on whether the

input or output is overdriven and by how much the range

is exceeded. The CLCx011 will typically recover in less

than 50ns from an overdrive condition. Figure 7 shows the

CLC1011 in an overdriven condition.

-3

-2.5

-2

-1.5

-1

-0.5

0.5

1.5

2.5

Time (us)

Output

Input

G = 5

Figure 7. Overdrive Recovery

Layout Considerations

General layout and supply bypassing play major roles in

high frequency performance. CaDeKa has evaluation

boards to use as a guide for high frequency layout and as

an aid in device testing and characterization. Follow the

steps below as a basis for high frequency layout:

▪ Include 6.8µF and 0.1µF ceramic capacitors for power

supply decoupling

▪ Placethe6.8µFcapacitorwithin0.75inchesofthepowerpin

▪ Placethe0.1µFcapacitorwithin0.1inchesofthepowerpin

▪ Remove the ground plane under and around the part,

especially near the input and output pins to reduce

parasitic capacitance

▪ Minimize all trace lengths to reduce series inductances

Refer to the evaluation board layouts below for more

information.

Evaluation Board Information

The following evaluation boards are available to aid in the

testing and layout of these devices:

Evaluation Board #

Products

CEB011

CLC1011 in SC70

CEB002

CLC1011 in SOT23

CEB006

CLC2011 in SOIC

CEB010

CLC2011 in MSOP

CEB018

CLC4011 in SOIC

CEB017

CLC4011 in TSSOP

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