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SML1001RHN 数据表(PDF) 2 Page - Seme LAB

部件名 SML1001RHN
功能描述  N-CHANNEL ENHANCEMENT MODE HIGH VOLTAGE POWER MOSFETS
PDF  2 Pages
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制造商  SEME-LAB [Seme LAB]
网页  http://www.semelab.co.uk
标志 SEME-LAB - Seme LAB

SML1001RHN 数据表(HTML) 2 Page - Seme LAB

  SML1001RHN Datasheet HTML 1Page - Seme LAB SML1001RHN Datasheet HTML 2Page - Seme LAB  
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SML1001RHN
SML901RHN0
Prelim. 7/98
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: sales@semelab.co.uk
Website: http://www.semelab.co.uk
Characteristic
Test Conditions.
Min.
Typ.
Max. Unit
Ciss
Coss
Crss
Qg
Qgs
Qgd
td(on)
tr
td(off)
tf
Characteristic / Test Conditions.
Part Number
Min.
Typ.
Max. Unit
10
40
1.3
320
636
1200
2.2
4.5
9
IS
ISM
VSD
trr
Qrr
Continuous Source Current (Body Diode)
Pulsed Source Current1 (Body Diode)
Diode Forward Voltage2
Reverse Recovery Time
Reverse Recovery Charge
VGS = 0V
IS = – ID [Cont.]
IS = – ID [Cont.]
dls / dt = 100A/ms
A
A
V
ns
µC
Characteristic / Test Conditions / Part Number
Min.
Typ.
Max. Unit
250
250
40
SOA1
SOA2
ILM
VDS = 0.4 VDSS , IDS = PD / 0.4 VDSS , t = 1 Sec
IDS = IDS [Cont.] , VDS = PD / ID [Cont.] , t = 1 Sec
Safe Operating Area
Safe Operating Area
Inductive Current Clamped
W
A
Characteristic / Test Conditions.
Min.
Typ.
Max. Unit
0.50
40
RqJC
Junction to Case
Junction to Ambient
°C/W
°C/W
DYNAMIC CHARACTERISTICS
SOURCE – DRAIN DIODE RATINGS AND CHARACTERISTICS
SAFE OPERATING AREA CHARACTERISTICS
THERMAL CHARACTERISTICS (Tcase =25°C unless otherwise stated)
1) Repetitive Rating: Pulse Width limited by maximum junction temperature.
2) Pulse Test: Pulse Width < 380
µS , Duty Cycle < 2%
3) See MIL–STD–750 Method 3471
Input capacitance
Output capacitance
Reverse transfer capacitance
Total Gate Charge3
Gate – Source Charge
Gate – Drain (“Miller”) Charge
Turn–on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
VGS = 0V
VDS = 25V
f = 1MHz
VGS = 10V
ID = ID [Cont.]
VDD = 0.5 VDSS
VDD = 0.5 VDSS
ID = ID [Cont.]
VGS = 15V
RG = 1.8W
pF
nC
ns
2460
2950
360
500
105
160
90
130
9.3
14
47
70
15
30
16
32
64
95
24
48



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