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ACT5830 数据表(PDF) 9 Page - Active-Semi, Inc |
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ACT5830 数据表(HTML) 9 Page - Active-Semi, Inc |
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9 / 41 page ![]() SYSTEM MANAGEMENT ACT5830 Rev 2, 20-Jan-11 Innovative Power TM - 9 - www.active-semi.com Copyright © 2010 Active-Semi, Inc. ActivePMU TM is a trademark of Active-Semi. I 2CTM is a trademark of NXP. ® I 2C INTERFACE ELECTRICAL CHARACTERISTICS PARAMETER TEST CONDITIONS MIN TYP MAX UNIT SCL, SDA Low Input Voltage 0.4 V SCL, SDA High Input Voltage 1.4 V SCL, SDA Leakage Current VCHG_IN = 4.2V 1 µA SDA Low Output Voltage IOL = 5mA 0.3 V SCL Clock Period, tSCL fSCL clock freq = 400kHz 2.5 µs SDA Data In Setup Time to SCL High, tSU 100 ns SDA Data Out Hold Time after SCL Low, tHD 300 ns SDA Data Low Setup Time to SCL Low, tST Start Condition 100 ns SDA Data High Hold Time after Clock High, tSP Stop Condition 100 ns Figure 1: I 2C Serial Bus Timing Note: Each session of data transfer is with a start condition, a 7-bits slave address plus a bit to instruct for read or write followed by an acknowledge bit, a register address byte followed by an acknowledge bit, a data byte followed by an acknowledge bit and a stop condi- tion. The device address, the register address and the data are all MSB first transferred. Each bit volume is prepared in during the SCL is low, is latched-in by the rising edge of the SCL. The data byte is accepted and is put effective by the time that the last bit volume is latched-in. |
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