ISO7420E, ISO7420FE, ISO7420FCC

ISO7421E, ISO7421FE, ISO7421FCC

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SLLSE45D

– DECEMBER 2010 – REVISED DECEMBER 2011

ABSOLUTE MAXIMUM RATINGS

(1)

VALUE

–0.5 V to 6 V

Voltage at IN, OUT

–0.5 V to 6 V

Output current

±15 mA

Human-body model

JEDEC Standard 22, Test Method A114-C.01

±3 kV

Electrostatic

Field-induced charged-device

ESD

JEDEC Standard 22, Test Method C101

All pins

±1.5 kV

discharge

model

Machine model

ANSI/ESDS5.2-1996

±200 V

150

°C

Storage temperature

-65

°C to 150°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltage values except differential I/O bus voltages are with respect to network ground terminal and are peak voltage values.

RECOMMENDED OPERATING CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

3.0

5.5

V

High-level output current

–4

mA

Low-level output current

4

mA

High-level input voltage

2

V

Low-level input voltage

0

0.8

V

Input pulse duration

20

ns

Signaling rate

0

Mbps

(2)

Junction temperature

–40

136

°C

Ambient Temperature

-40

25

125

°C

(1)

Under typical conditions, E-grade devices are capable of signaling rate

> 150 Mbps.

(2)

Copyright

© 2010–2011, Texas Instruments Incorporated

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