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SSG4502CE 数据表(PDF) 2 Page - SeCoS Halbleitertechnologie GmbH |
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SSG4502CE 数据表(HTML) 2 Page - SeCoS Halbleitertechnologie GmbH |
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2 / 7 page ![]() SSG4502CE N & P-Ch Enhancement Mode Power MOSFET N-Ch: 10.0 A, 30 V, RDS(ON) 16 mΩ Ω Ω Ω P-Ch: -8.5A, -30 V, RDS(ON) 23 mΩ Ω Ω Ω Elektronische Bauelemente 26-Dec-2011 Rev. A Page 2 of 7 http://www.SeCoSGmbH.com/ Any changes of specification will not be informed individually. N-CHANNEL ELECTRICAL CHARACTERISTICS (TA=25°C unless otherwise specified) Parameter Symbol Min. Typ. Max. Unit Test Conditions Static Drain-Source Breakdown Voltage V(BR)DSS 30 - - V VGS=0, ID=250µA Gate Threshold Voltage VGS(th) 1 - - V VDS=VGS, ID=250µA Gate-Source Leakage Current IGSS - - ±10 nA VGS= 20V, VDS=0 Drain-Source Leakage Current IDSS - - 1 µA VDS=24V, VGS=0 On-State Drain Current 1 ID(ON) - - 20 A VDS=5V, VGS=10V Static Drain-Source On-Resistance 1 RDS(ON) - - 16 m VGS=10V, ID=10A - - 20 VGS=4.5V, ID=8.4A Forward Transconductance 1 gfs - 40 - S VDS=15V, ID=10A Pulsed Source Current (Body Diode) 1 ISM - 5 - A Dynamic Total Gate Charge Qg - 12 nC ID=10A VDS=15V VGS=4.5V Gate-Source Charge Qgs - 3.3 - Gate-Drain (“Miller”) Change Qgd - 4.5 - Turn-on Delay Time Td(on) - 20 - nS VDD=15V VGS=10V ID=1A RGEN=25 Rise Time Tr - 9 - Turn-off Delay Time Td(off) - 70 - Fall Time Tf - 20 - Notes: 1. Pulse test: PW ≦ 300us duty cycle ≦ 2%. 2. Guaranteed by design, not subject to production testing. |
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