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ADL5606ACPZ-R7 数据表(PDF) 15 Page - Analog Devices |
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ADL5606ACPZ-R7 数据表(HTML) 15 Page - Analog Devices |
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15 / 20 page ![]() ADL5606 Rev. 0 | Page 15 of 20 ACPR AND EVM All adjacent channel power ratio (ACPR) and error vector magnitude (EVM) measurements were made using a single W-CDMA carrier and Test Model 1-64. The signal is generated by a very low ACPR source and is meas- ured at the output by a high dynamic range spectrum analyzer. For ACPR measurements, the filter setting was chosen for low ACPR; for EVM measurements, the low EVM setting was selected. The spectrum analyzer incorporates an instrument noise correc- tion function, and highly linear amplifiers were used to boost the power levels for ACPR measurements. Figure 26 shows ACPR vs. POUT at 1960 MHz and 2140 MHz. For power levels up to 18 dBm, an ACPR of 50 dBc or better can be achieved at 1960 MHz and 2140 MHz. Figure 27 shows EVM vs. POUT at 1960 MHz and 2140 MHz. The EVM measured is 0.5% for power levels up to 18 dBm at 1960 MHz and 2140 MHz. The baseline composite EVM for the signal source was approximately 0.5%. When operated in the linear region, there is little or no contribution to EVM by the amplifier. THERMAL CONSIDERATIONS The ADL5606 is packaged in a thermally efficient 4 mm × 4 mm, 16-lead LFCSP. The thermal resistance from junction to air (θJA) is 52.9°C/W. The thermal resistance for the product was extracted assuming a standard 4-layer JEDEC board with 25 copper plated thermal vias. The thermal vias are filled with conductive copper paste (AE3030 with thermal conductivity of 7.8 W/mK and thermal expansion α1 of 4 × 10−5/°C and α2 of 8.6 × 10−5/°C). The thermal resistance from junction to case (θJC) is 12.9°C/W, where the case is the exposed pad of the lead frame package. For the best thermal performance, it is recommended that as many thermal vias as possible be added under the exposed pad of the LFCSP. The thermal resistance values assume a minimum of 25 thermal vias arranged in a 5 × 5 array with a via diameter of 8 mils, via pad of 16 mils, and a pitch of 20 mils. The vias are plated with copper, and the drill hole is filled with a conductive copper paste. For optimal performance, it is recommended that the thermal vias be filled with a conductive paste of the equivalent thermal conductivity specified earlier in this section; alternatively, an external heat sink can be used to dissipate heat quickly without affecting the die junction temperature. It is also recommended that the ground pattern be extended above and below the device to improve thermal efficiency (see Figure 35). SOLDERING INFORMATION AND RECOMMENDED PCB LAND PATTERN Figure 35 shows the recommended land pattern for the ADL5606. To minimize thermal impedance, the exposed paddle on the 4 mm × 4 mm LFCSP is soldered to a ground plane along with Pin 5 to Pin 8 and Pin 13 to Pin 16. To improve thermal dissi- pation, 25 thermal vias are arranged in a 5 × 5 array under the exposed paddle. Areas above and below the paddle are tied with regular vias. If multiple ground layers exist, they should be tied together using vias. For more information about land pattern design and layout, see the AN-772 Application Note, A Design and Manufacturing Guide for the Lead Frame Chip Scale Package (LFCSP). RFOUT RFIN 16 MIL VIA PAD WITH 8 MIL VIA 16 13 58 Figure 35. Recommended Land Pattern |
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