| 数据搜索系统,热门电子元器件搜索 |
|
REF191 数据表(PDF) 30 Page - Analog Devices |
|
|
|||||||||||||||||||||||||||||
REF191 数据表(HTML) 30 Page - Analog Devices |
|
30 / 32 page ![]() ADR4520/ADR4525/ADR4530/ADR4533/ADR4540/ADR4550 Data Sheet Rev. 0 | Page 30 of 32 THEORY OF OPERATION The ADR4520/ADR4525/ADR4530/ADR4533/ADR4540/ ADR4550 series of references uses a unique core topology for extremely high accuracy, stability, and noise performance. Three parameters contribute to the accuracy of the dc output of a voltage reference: initial accuracy, temperature coefficient, and long-term drift. With an outstanding guaranteed initial error of 0.02% and a low temperature coefficient of 2 ppm/°C maximum, this series of voltage references is perfect for high precision applications. The industry-leading long-term stability of the devices means that systems need less frequent field calibration and that there is a reduction in the costly preshipment system burn-in time. LONG-TERM DRIFT One of the key parameters of the ADR4520/ADR4525/ADR4530/ ADR4533/ADR4540/ADR4550 references is long-term stability—the output drift over time that the device is powered up. Regardless of output voltage, internal testing during development showed a typical drift of approximately 25 ppm after 1000 hours of continuous, nonloaded operation in a 60°C extremely stable temperature controlled environment. Note that the majority of the long-term drift typically occurs in the first 200 hours to 300 hours of operation. For systems that require highly stable output voltages over long periods of time, the designer should consider burning in the devices prior to use to minimize the amount of output drift exhibited by the reference over time. See the AN-713 Application Note, The Effect of Long-Term Drift on Voltage References, at www.analog.com for more information regarding the effects of long-term drift and how it can be minimized. POWER DISSIPATION The ADR4520/ADR4525/ADR4530/ADR4533/ADR4540/ ADR4550 voltage references are capable of sourcing and sinking up to 10 mA of load current at room temperature across the rated input voltage range. However, when used in applications subject to high ambient temperatures, the input voltage and load current should be carefully monitored to ensure that the device does not exceeded its maximum power dissipation rating. The maximum power dissipation of the device can be calculated via the following equation: JA A J D T T P θ − = where: PD is the device power dissipation. TJ is the device junction temperature. TA is the ambient temperature. θJA is the package (junction-to-air) thermal resistance. Due to this relationship, acceptable load current in high temperature conditions may be less than the maximum current sourcing capability of the device. In no case should the part be operated outside of its maximum power rating because doing so may result in premature failure or permanent damage to the device. |
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |