6

SP488E/489EDS/07

SP488E/489E Enhanced Quad RS-485/RS-422 Line Receivers

© Copyright 2000 Sipex Corporation

R

C

C

S

R

S

SW1

SW1

SW2

SW2

Device

Under

Test

DC Power

Source

SW1

SW2

Figure 5. ESD Test Circuit for Human Body Model

R

RS

S and

and R

RV

V add up to 330

add up to 330

Ω

Ω ffor IEC1000-4-2.

or IEC1000-4-2.

RS and RV add up to 330Ω for IEC1000-4-2.

Contact-Discharge Module

Contact-Discharge Module

R

R

C

C

R

SW1

SW1

SW2

SW2

Device

Under

Test

DC Power

Source

SW1

SW2

Contact-Discharge Module

Figure 6. ESD Test Circuit for IEC1000-4-2

ESD TOLERANCE

The SP488E and SP489E devices incorporate

ruggedized ESD cells on all driver output and

receiver input pins. The ESD structure is

improved over our previous family for more

rugged applications and environments sensitive

to electro-static discharges and associated

transients. The improved ESD tolerance is at

least +15kV without damage nor latch-up.

There are different methods of ESD testing

applied:

a) MIL-STD-883, Method 3015.7

b) IEC1000-4-2 Air-Discharge

c) IEC1000-4-2 Direct Contact

The Human Body Model has been the generally

accepted ESD testing method for semiconductors.

This method is also specified in MIL-STD-883,

Method 3015.7 for ESD testing. The premise of

this ESD test is to simulate the human body’s

potential to store electro-static energy and

discharge it to an integrated circuit. The

simulation is performed by using a test model as

shown in Figure 5. This method will test the IC’s

capability to withstand an ESD transient during

normal handling such as in manufacturing areas

where the ICs tend to be handled frequently.

The IEC-1000-4-2, formerly IEC801-2, is

generally used for testing ESD on equipment and

systems. For system manufacturers, they must

guarantee a certain amount of ESD protection

since the system itself is exposed to the outside