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SP526CF 数据表(PDF) 19 Page - Sipex Corporation |
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SP526CF 数据表(HTML) 19 Page - Sipex Corporation |
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19 / 23 page  19 Rev: B Date:7/7/04 SP526 Multi–Mode Serial Transceiver © Copyright 2004 Sipex Corporation Phase 4 — V DD transfer — The fourth phase of the clock connects the negative terminal of C 2 to ground, and transfers the generated l0V across C 2 to C4, the V DD storage capacitor. Again, simultaneously with this, the positive side of capacitor C 1 is switched to +5V and the negative side is con- nected to ground, and the cycle begins again. Since both V+ and V– are separately generated from V CC; in a no–load condition V + and V– will be symmetrical. Older charge pump approaches that generate V– from V+ will show a decrease in the magnitude of V– compared to V+ due to the inherent inefficiencies in the design. The clock rate for the charge pump typically operates at 15kHz. The external capacitors can be as low as 1.0 µF with a 16V breakdown voltage rating. ESD Tolerance The SP526 device incorporates ruggedized ESD cells on all driver output and receiver input pins. The ESD structure is improved over our previous family for more rugged applications and environments sensitive to electro-static discharges and associated transients. The improved ESD tolerance is at least ±15kV without damage nor latch-up. There are different methods of ESD testing applied: a) MIL-STD-883, Method 3015.7 b) IEC1000-4-2 Air-Discharge c) IEC1000-4-2 Direct Contact The Human Body Model has been the generally accepted ESD testing method for semiconductors. This method is also specified in MIL-STD-883, Method 3015.7 for ESD testing. The premise of this ESD test is to simulate the human body’s potential to store electro-static energy and discharge it to an integrated circuit. The simulation is performed by using a test model as shown in Figure 35. This method will test the IC’s capability to withstand an ESD transient during normal handling such as in manufacturing areas where the ICs tend to be handled frequently. The IEC-1000-4-2, formerly IEC801-2, is generally used for testing ESD on equipment and systems. For system manufacturers, they must guarantee a certain amount of ESD protection since the system itself is exposed to the outside environment and human presence. The premise with IEC1000-4-2 is that the system is required to withstand an amount of static electricity when ESD is applied to points and surfaces of the equipment that are accessible to personnel during normal usage. The transceiver IC receives most RC SW DC Power Source CS RS SW2 Device Under Test Figure 35. ESD Test Circuit for Human Body Model |
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