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DAC5571IDBVT 数据表(PDF) 2 Page - Texas Instruments

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部件名 DAC5571IDBVT
功能描述  2.7 V to 5.5 V, I2C INTERFACE, VOLTAGE OUTPUT, 8-BIT DIGITAL-TO-ANALOG CONVERTER
PDF  24 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

DAC5571IDBVT 数据表(HTML) 2 Page - Texas Instruments

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PIN CONFIGURATIONS
A0
SCL
SDA
6
5
4
1
2
3
VOUT
GND
VDD
1
2
3
6
5
4
(TOP VIEW)
(BOTTOM VIEW)
Lot Trace Code
ABSOLUTE MAXIMUM RATINGS
(1)
DAC5571
SLAS405A – DECEMBER 2003 – REVISED AUGUST 2005
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
PACKAGE
SPECIFIED TEM-
PACKAGE
ORDERING NUM-
PRODUCT
PACKAGE
DESIG-
TRANSPORT MEDIA
PERATURE RANGE
MARKING
BER
NATOR
DAC5571IDBVT
250-Piece Small Tape and Reel
DAC5571
SOT23-6
DBV
–40°C to +105°C
D571
DAC5571IDBVR
3000-Piece Tape and Reel
PIN DESCRIPTION (SOT23-6)
PIN
NAME
DESCRIPTION
1
VOUT
Analog output voltage from DAC
Ground reference point for all
2
GND
circuitry
3
VDD
Analog Voltage Supply Input
4
SDA
Serial Data Input
5
SCL
Serial Clock Input
6
A0
Device Address Select
LOT
Year (3 = 2003); M onth (1–9 = JAN–SEP; A=OCT,
TRACE
B=NOV, C=DEC); LL– Random code generated
CODE:
when assembly is requested
UNITS
VDD to GND
– 0.3 V to +6 V
Digital input voltage to GND
–0.3 V to +VDD+0.3 V
VOUT to GND
– 0.3 V to +VDD+0.3 V
Operating temperature range
–40°C to +105°C
Storage temperature range
–65°C to +150°C
Junction temperature range (TJ max)
+150°C
Power dissipation
(TJmax - TA)RΘJA
Thermal impedance, RΘJA
240°C/W
Lead temperature, soldering
Vapor phase (60s)
215°C
Infrared (15s)
220°C
(1)
Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2



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