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SN74LVC32AMDREP 数据表(PDF) 1 Page - Texas Instruments

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部件名 SN74LVC32AMDREP
功能描述  QUADRUPLE 2-INPUT POSITIVE-OR GATE
PDF  13 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

SN74LVC32AMDREP 数据表(HTML) 1 Page - Texas Instruments

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FEATURES
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
VCC
4B
4A
4Y
3B
3A
3Y
D OR PW PACKAGE
(TOP VIEW)
DESCRIPTION/ORDERING INFORMATION
The device performs the Boolean function Y + A ) B or Y + A • B in positive logic.
SN74LVC32A-EP
QUADRUPLE 2-INPUT POSITIVE-OR GATE
SCAS733C – NOVEMBER 2003 – REVISED MARCH 2007
• Inputs Accept Voltages to 5.5 V
• Controlled Baseline
• Max t
pd of 3.8 ns at 3.3 V
–
One Assembly/Test Site, One Fabrication
• Typical V
OLP (Output Ground Bounce)
Site
<0.8 V at V
CC = 3.3 V, TA = 25°C
• Extended Temperature Performance of
• Typical V
OHV (Output VOH Undershoot)
–40
°C to 125°C and –55°C to 125°C
>2 V at V
CC = 3.3 V, TA = 25°C
• Enhanced Diminishing Manufacturing Sources
• ESD Protection Exceeds JESD 22
(DMS) Support
–
2000-V Human-Body Model (A114-A)
• Enhanced Product-Change Notification
–
200-V Machine Model (A115-A)
• Qualification Pedigree (1)
–
1000-V Charged-Device Model (C101)
• ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
• Operates From 2 V to 3.6 V
(1)
Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
The SN74LVC32A quadruple 2-input positive-OR gate is designed for 2.7-V to 3.6-V VCC operation.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in
a mixed 3.3-V/5-V system environment.
ORDERING INFORMATION(1)
TA
PACKAGE(2)
ORDERABLE PART NUMBER
TOP-SIDE MARKING
SOIC – D
Reel of 2500
SN74LVC32AQDREP
LVC32AE
–40
°C to 125°C
TSSOP – PW
Reel of 2000
SN74LVC32AQPWREP
LVC32AE
SOIC – D
Reel of 2500
SN74LVC32AMDREP
LVC32AM
–55
°C to 125°C
TSSOP – PW
Reel of 2000
SN74LVC32AMPWREP
LVC32AM
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2)
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
FUNCTION TABLE
(EACH GATE)
INPUTS
OUTPUT
Y
A
B
H
X
H
X
H
H
L
L
L
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003–2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
On products compliant to MIL-PRF-38535, all parameters are
Instruments standard warranty. Production processing does not
tested unless otherwise noted. On all other products, production
necessarily include testing of all parameters.
processing does not necessarily include testing of all parameters.


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