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PIN ASSIGNMENTS

1

2

3

4

5

6

7

8

GND

LD

A1

A2

H–

AL

H+

V

CC

D PACKAGE

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TMP821

SLDS152 – JANUARY 2008

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

TERMINAL FUNCTIONS

TERMINAL

DESCRIPTION

NAME

NO.

VCC

1

Power input (4 V to 28 V)

H+

2

Positive Hall input

Speed indication

AL

3

Note: May remain high for several hundred milliseconds after power-on.

H–

4

Negative Hall input

GND

5

Ground

LD

6

Timing capacitor

A1

7

Driver output

A2

8

Driver output

2

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