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TLC876CPWR 数据表(PDF) 8 Page - Texas Instruments |
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TLC876CPWR 数据表(HTML) 8 Page - Texas Instruments |
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8 / 22 page ![]() TLC876M, TLC876I, TLC876C 10-BIT 20 MSPS PARALLEL OUTPUT CMOS ANALOG-TO-DIGITAL CONVERTERS SLAS140E – JULY 1997 – REVISED OCTOBER 2000 8 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 operating characteristics at AVDD = DVDD = 5 V, DRVDD = 3.3 V, VI(REFT) = 3.6 V, VI(REFB) = 1.6 V, fCLK = 20 MSPS (unless otherwise noted) timing requirements PARAMETER TEST CONDITIONS MIN TYP MAX UNIT fconv Maximum conversion rate (see Note 2) 20 MHz td(o) Delay time, output CL = 20 pF 5 20 ns td(pipe) Delay time, pipeline, latency 3.5 Clock cycles td(A) Delay time, aperture 4 ns Aperture jitter 22 ps tdis(DD) Disable time, OE ↑ to Hi-Z CL =20 pF 5 15 ns ten(HL) Enable time, OE ↓ to valid data CL = 20 pF 5 15 ns NOTE 2: The conversion rate can be a minimum of 10 kHz without degradation in specified performance. PARAMETER MEASUREMENT INFORMATION D0 – D9 Data N–4 Data N–3 Data N–2 Data N–1 Data N tc tw(CLKH) tw(CLKL) Sample N Sample N+1 Sample N+2 AIN CLK td(o) td(pipe) td(A) td(o) Figure 1. Timing Diagram tdis(DD) ten(HL) High Impedance Active OE D0–D9 Figure 2. Output Enable to Data Output Timing Diagram STBY CLK Output Data Valid Figure 3. Standby Timing |
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