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SWRA370 数据表(PDF) 13 Page - Texas Instruments

部件名 SWRA370
功能描述  Basic RF Testing of CCxxxx Devices
PDF  34 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

SWRA370 数据表(HTML) 13 Page - Texas Instruments

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100 kHz
-
20 dB or more
-
30 dBm or less
3.5 MHz
2450
2455
2460
2458.5
MHz
PC with SmartRF Studio installed
SmartRF Eval Board
and Eval Module
Spectrum Analyzer
www.ti.com
Transmission Tests
5.2
Power Spectral Density Mask
Purpose: To verify that the PSD of the DUT is able to conform to stated conformance limits.
Pass Condition: Refer to the respective standards document. Table 6 shows an example for the IEEE
802.15.4 standards requirements. Figure 4 illustrates the requirements.
Table 6. IEEE 802.15.4 Standards Requirements (Example)
Frequency
Relative Limit
Absolute Limit
|f
– f
C| > 3.5 MHz
–20 dB
–30 dBm
Figure 4. Power Spectral Density Mask Requirements
Test Environment: Figure 5 shows the test setup.
Figure 5. Power Spectral Density Mask Test Setup
Procedure:
Step 1.
Connect the instruments and test board as shown in Figure 5.
Step 2.
Set the EM to continuous TX mode through SmartRF Studio.
Step 3.
Verify that the PSD mask conforms to the given standard on the spectrum analyzer.
Table 7. Power Spectral Density Mask Test Results
Design Specification
PSD Relative Limit (%)
(%)
Pass/Fail?
Freq 1 (MHz)
Freq 2 (MHz)
Freq 3 (MHz)
xx
xx
Test Results:
13
SWRA370
– August 2011
Basic RF Testing of CCxxxx Devices
Submit Documentation Feedback
Copyright
© 2011, Texas Instruments Incorporated



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