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RN1908AFS 数据表(PDF) 1 Page - Toshiba Semiconductor

部件名 RN1908AFS
功能描述  Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications
PDF  6 Pages
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制造商  TOSHIBA [Toshiba Semiconductor]
网页  http://www.semicon.toshiba.co.jp/eng
标志 TOSHIBA - Toshiba Semiconductor

RN1908AFS 数据表(HTML) 1 Page - Toshiba Semiconductor

  RN1908AFS Datasheet HTML 1Page - Toshiba Semiconductor RN1908AFS Datasheet HTML 2Page - Toshiba Semiconductor RN1908AFS Datasheet HTML 3Page - Toshiba Semiconductor RN1908AFS Datasheet HTML 4Page - Toshiba Semiconductor RN1908AFS Datasheet HTML 5Page - Toshiba Semiconductor RN1908AFS Datasheet HTML 6Page - Toshiba Semiconductor  
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RN1907AFS~RN1909AFS
2007-11-01
1
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) (Transistor with Built-in Bias Resistor)
RN1907AFS, RN1908AFS, RN1909AFS
Switching, Inverter Circuit, Interface Circuit and
Driver Circuit Applications
• Two devices are incorporated into a fine-pitch, small-mold (6-pin)
package.
• Incorporating a bias resistor into a transistor reduces the parts count.
Reducing the parts count enables the manufacture of ever more
compact equipment and lowers the assembly cost.
• Complementary to the RN2907AFS~RN2909AFS
Equivalent Circuit and Bias Resistor Values
Absolute Maximum Ratings (Ta = 25°C)
(Q1, Q2 common)
Characteristic
Symbol
Rating
Unit
Collector-base voltage
VCBO
50
V
Collector-emitter voltage
RN1907AFS~RN1909AFS
VCEO
50
V
RN1907AFS
6
RN1908AFS
7
Emitter-base voltage
RN1909AFS
VEBO
15
V
Collector current
IC
80
mA
Collector power dissipation
PC (Note 1)
50
mW
Junction temperature
Tj
150
°C
Storage temperature range
RN1907AFS~RN1909AFS
Tstg
−55~150
°C
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Total rating
Unit: mm
JEDEC
―
JEITA
―
TOSHIBA
2-1F1D
Weight: 0.001 g (typ.)
R1
B
C
E
Type No.
R1 (k
Ω)
R2 (k
Ω)
RN1907AFS
10
47
RN1908AFS
22
47
RN1909AFS
47
22
Equivalent Circuit
(top view)
fS6
1. EMITTER1
2. BASE1
3. COLLECTOR2
4. EMITTER2
5. BASE2
6. COLLECTOR1
(E1)
(B1)
(C2)
(E2)
(B2)
(C1)
0.1±0.05
6
0.8±0.05
1.0±0.05
1
2
0.1±0.05
3
5
4
6
5
4
1
2
3
Q1
Q2


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