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AD5233 数据表(PDF) 12 Page - Analog Devices |
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AD5233 数据表(HTML) 12 Page - Analog Devices |
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12 / 16 page ![]() REV. 0 AD5207 –12– TEST CIRCUITS Figures 10 to 18 define the test conditions used in product Specification table. VMS A W B DUT V+ V+ = VDD 1 LSB = V+/2N Figure 10. Potentiometer Divider Nonlinearity Error Test Circuit (INL, DNL) VMS A W B DUT NO CONNECT IW Figure 11. Resistor Position Nonlinearity Error (Rheostat Operation; R-INL, R-DNL) VMS1 A W B DUT IW = VDD/RNOMINAL VMS2 VW RW = [VMS1 – VMS2]/IW Figure 12. Wiper Resistance Test Circuit VMS% VDD% PSS (%/%) = V+ = VDD 10% PSRR (dB) = 20 LOG VMS VDD VMS A W B V+ VDD VA Figure 13. Power Supply Sensitivity Test Circuit (PSS, PSSR) OP279 W 5V B VOUT OFFSET GND OFFSET BIAS A DUT VIN Figure 14. Inverting Gain Test Circuit OFFSET BIAS B OFFSET GND A DUT OP279 W 5V VOUT VIN Figure 15. Noninverting Gain Test Circuit OP42 VOUT VIN +15V OFFSET GND –15V W B A 2.5V DUT Figure 16. Gain vs. Frequency Test Circuit W B VSS TO VDD DUT ISW CODE = H RSW = 0.1V ISW 0.1V + – Figure 17. Incremental ON Resistance Test Circuit ICM A W B NC GND NC VSS VDD DUT VCM NC = NO CONNECT Figure 18. Common-Mode Leakage Current Test Circuit |
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