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ADE7752 数据表(PDF) 3 Page - Analog Devices |
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ADE7752 数据表(HTML) 3 Page - Analog Devices |
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3 / 10 page ![]() REV. PrB 08/01 PRELIMINARY TECHNICAL DATA 3– ADE7752 TIMING CHARACTERISTICS1, 2 Parameter Units Test Conditions/Comments t1 3 275 ms F1 and F2 Pulsewidth (Logic High) t2 See Table III sec Output Pulse Period. See Transfer Function Section t3 1/2 t2 sec Time Between F1 Falling Edge and F2 Falling Edge t4 3, 4 90 ms CF Pulsewidth (Logic High) t5 See Table IV sec CF Pulse Period. See Transfer Function Section t6 CLKIN/4 sec Minimum Time Between F1 and F2 Pulse NOTES 1Sample tested during initial release and after any redesign or process change that may affect this parameter. 2See Figure 1. 3The pulsewidths of F1, F2 and CF are not fixed for higher output frequencies. See Frequency Outputs Section. 4The CF pulse is always 1 µs in the high frequency mode. See Frequency Outputs section and Table IV. Specifications subject to change without notice. ORDERING GUIDE Model Package Description Package Option ADE7752AR SOIC Package R-24 EVAL-ADE7752EB ADE7752 Evaluation Board (VDD = 5 V 5%, AGND = DGND = 0 V, On-Chip Reference, CLKIN = 10 MHz, TMIN to TMAX = –40 C to +85 C) F1 F2 CF t1 t6 t2 t3 t4 t5 Figure 1. Timing Diagram for Frequency Outputs |
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