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ADF4111BCP 数据表(PDF) 3 Page - Analog Devices

部件名 ADF4111BCP
功能描述  RF PLL Frequency Synthesizers
PDF  24 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADF4111BCP 数据表(HTML) 3 Page - Analog Devices

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REV. 0
–3–
ADF4110/ADF4111/ADF4112/ADF4113
Parameter
B Version
B Chips
2
Unit
Test Conditions/Comments
NOISE CHARACTERISTICS
ADF4113 Phase Noise Floor
7
–171
–171
dBc/Hz typ
@ 25 kHz PFD Frequency
–164
–164
dBc/Hz typ
@ 200 kHz PFD Frequency
Phase Noise Performance
8
@ VCO Output
ADF4110: 540 MHz Output
9
–91
–91
dBc/Hz typ
@ 1 kHz Offset and 200 kHz PFD Frequency
ADF4111: 900 MHz Output
10
–87
–87
dBc/Hz typ
@ 1 kHz Offset and 200 kHz PFD Frequency
ADF4112: 900 MHz Output
10
–90
–90
dBc/Hz typ
@ 1 kHz Offset and 200 kHz PFD Frequency
ADF4113: 900 MHz Output
10
–91
–91
dBc/Hz typ
@ 1 kHz Offset and 200 kHz PFD Frequency
ADF4111: 836 MHz Output
11
–78
–78
dBc/Hz typ
@ 300 Hz Offset and 30 kHz PFD Frequency
ADF4112: 1750 MHz Output
12
–86
–86
dBc/Hz typ
@ 1 kHz Offset and 200 kHz PFD Frequency
ADF4112: 1750 MHz Output
13
–66
–66
dBc/Hz typ
@ 200 Hz Offset and 10 kHz PFD Frequency
ADF4112: 1960 MHz Output
14
–84
–84
dBc/Hz typ
@ 1 kHz Offset and 200 kHz PFD Frequency
ADF4113: 1960 MHz Output
14
–85
–85
dBc/Hz typ
@ 1 kHz Offset and 200 kHz PFD Frequency
ADF4113: 3100 MHz Output
15
–86
–86
dBc/Hz typ
@ 1 kHz Offset and 1 MHz PFD Frequency
Spurious Signals
ADF4110: 540 MHz Output
9
–97/–106
–97/–106
dBc typ
@ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4111: 900 MHz Output
10
–98/–110
–98/–110
dBc typ
@ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4112: 900 MHz Output
10
–91/–100
–91/–100
dBc typ
@ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4113: 900 MHz Output
10
–100/–110
–100/–110
dBc typ
@ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4111: 836 MHz Output
11
–81/–84
–81/–84
dBc typ
@ 30 kHz/60 kHz and 30 kHz PFD Frequency
ADF4112: 1750 MHz Output
12
–88/–90
–88/–90
dBc typ
@ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4112: 1750 MHz Output
13
–65/–73
–65/–73
dBc typ
@ 10 kHz/20 kHz and 10 kHz PFD Frequency
ADF4112: 1960 MHz Output
14
–80/–84
–80/–84
dBc typ
@ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4113: 1960 MHz Output
14
–80/–84
–80/–84
dBc typ
@ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4113: 3100 MHz Output
15
–80/–82
–82/–82
dBc typ
@ 1 MHz/2 MHz and 1 MHz PFD Frequency
NOTES
1Operating temperature range is as follows: B Version: –40
°C to +85°C.
2The B Chip specifications are given as typical values.
3This is the maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency
which is less than this value.
4AV
DD = DVDD = 3 V; For AVDD = DVDD = 5 V, use CMOS-compatible levels.
5Guaranteed by design.
6T
A = 25
°C; AV
DD = DVDD = 3 V; P = 16; SYNC = 0; DLY = 0; RFIN for ADF4110 = 540 MHz; RFIN for ADF4111, ADF4112, ADF4113 = 900 MHz.
7The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20 logN (where N is the N divider value).
8The phase noise is measured with the EVAL-ADF411XEB1 Evaluation Board and the HP8562E Spectrum Analyzer. The spectrum analyzer provides the REFIN for
the synthesizer (fREFOUT = 10 MHz @ 0 dBm). SYNC = 0; DLY = 0 (See Table III).
9f
REFIN = 10 MHz; fPFD = 200 kHz; Offset frequency = 1 kHz; fRF = 540 MHz; N = 2700; Loop B/W = 20 kHz.
10f
REFIN = 10 MHz; fPFD = 200 kHz; Offset frequency = 1 kHz; fRF = 900 MHz; N = 4500; Loop B/W = 20 kHz.
11f
REFIN = 10 MHz; fPFD = 30 kHz; Offset frequency = 300 Hz; fRF = 836 MHz; N = 27867; Loop B/W = 3 kHz.
12f
REFIN = 10 MHz; fPFD = 200 kHz; Offset frequency = 1 kHz; fRF = 1750 MHz; N = 8750; Loop B/W = 20 kHz.
13f
REFIN = 10 MHz; fPFD = 10 kHz; Offset frequency = 200 Hz; fRF = 1750 MHz; N = 175000; Loop B/W = 1 kHz.
14f
REFIN = 10 MHz; fPFD = 200 kHz; Offset frequency = 1 kHz; fRF = 1960 MHz; N = 9800; Loop B/W = 20 kHz.
15f
REFIN = 10 MHz; fPFD = 1 MHz; Offset frequency = 1 kHz; fRF = 3100 MHz; N = 3100; Loop B/W = 20 kHz.
Specifications subject to change without notice.
TIMING CHARACTERISTICS1
Limit at TMIN to TMAX
Parameter
(B Version)
Unit
Test Conditions/Comments
t1
10
ns min
DATA to CLOCK Setup Time
t2
10
ns min
DATA to CLOCK Hold Time
t3
25
ns min
CLOCK High Duration
t4
25
ns min
CLOCK Low Duration
t5
10
ns min
CLOCK to LE Setup Time
t6
20
ns min
LE Pulsewidth
NOTES
1Guaranteed by design but not production tested.
Specifications subject to change without notice.
(AVDD = DVDD = 3 V
10%, 5 V
10%; AVDD
≤ VP ≤ 6.0 V; AGND = DGND = CPGND = 0 V;
RSET = 4.7 k ; TA = TMIN to TMAX unless otherwise noted)



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