MAT01AH datasheet(3/8 Pages) AD

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TYPICAL ELECTRICAL CHARACTERISTICS

MAT01N

Parameter

Symbol

Conditions

Typical

Units

Average Offset Voltage Drift

TCVOS

0.35

µV/°C

Average Offset Current Drift

TCIOS

pA/

°C

Collector-Emitter-Leakage

Current

ICES

VCE = 30 V, VBE = 0

Collector-Base-Leakage

Current

ICBO

VCB = 30 V, IE = 0

Gain Bandwidth Product

VCE = 10 V, IC = 10 mA

450

MHz

Offset Voltage Stability

∆V

OS/T

First Month (Note 1)

2.0

µV/Mo

Long-Term (Note 2)

0.2

µV/Mo

(@ VCB = 15 V and IC = 10 A, TA = +25 C, unless otherwise noted.)

NOTES

1Exclude first hour of operation to allow for stabilization.

2Parameter describes long-term average drift after first month of operation.

3Sample tested.

4The collector-base (I

CBO) and collector-emitter (ICES) leakage currents may be

reduced by a factor of two to ten times by connecting the substrate (package) to

a potential which is lower than either collector voltage.

CC and ICES are guaranteed by measurement of ICBO.

6Guaranteed by V

OS test (TCVOS ≅

for VOS

VBE) T = 298°K for TA = 25°C.

7Guaranteed by I

OS test limits over temperature.

Specifications subject to change without notice.

MAT01

–3–

REV. A

WAFER TEST LIMITS

MAT01N

Parameter

Symbol

Conditions

Limits

Units

Breakdown Voltage

BVCEO

IC = 100

µA45

V min

Offset Voltage

VOS

0.5

mV max

Offset Current

IOS

3.2

nA max

Bias Current

nA max

Current Gain

hFE

250

min

Current Gain Match

∆h

8.0

% max

Offset Voltage Change

∆V

OS/

∆V

≤ V

≤ 30 V

8.0

µV/V max

Offset Current Change

∆V

OS/

∆V

≤ V

≤ 30 V

pA/V max

Collector Saturation Voltage

VCE (SAT)

IB = 0.1 mA, IC = 1 mA

0.25

V max

NOTE

Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not

guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.

(@ VCB = 15 V, IC = 10 A, TA = +25 C, unless otherwise noted.)

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