REV. C

REF01

–4–

WAFER TEST LIMITS

REF01NT

REF01N

REF01GT

REF01G

Parameter

Symbol

Conditions

Limit

Limit

Limit

Limit

Unit

Output Voltage

10.05

10.03

10.10

10.05

V max

9.95

9.97

9.90

9.95

V min

Output Adjustment

Range

Ω±3.0

±3.0

% min

Line Regulation

0.015

0.01

0.015

0.01

%/V max

*Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed

for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.

unless otherwise noted.)*

TYPICAL ELECTRICAL CHARACTERISTICS

REF01NT

REF01N

REF01GT

REF01G

Parameter

Symbol

Conditions

Typical

Typical

Typical

Typical

Unit

Load Regulation

NT, GT @ 125

°C

0.007

0.005

0.009

0.006

%/mA

Output Voltage

Noise

0.1 Hz to 10 Hz

20

20

20

20

µV p-p

Turn-On Settling

To

±0.1% of Final

Time

Value NT, GT @

125

°C

7.5

5.0

7.5

5.0

µs

Quiescent Current

No Load, NT,

GT @ 125

°C

1.4

1.0

1.4

1.0

mA

Load Current

21

21

21

21

mA

Sink Current

–0.5

–0.5

–0.5

–0.5

mA

Short Circuit

Current

30

3030

30mA

Output Voltage

Temperature

Coefficient

10

10

10

10

ppm/

°C

*For 25

°C specifications of REF01NT and REF01GT, see REF01N and REF01G, respectively.