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M54HC08D 数据表(PDF) 13 Page - STMicroelectronics |
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M54HC08D 数据表(HTML) 13 Page - STMicroelectronics |
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13 / 29 page ![]() M54HCxxx - M54HCTxxx Radiation data Doc ID 17367 Rev 2 13/29 4 Radiation data Each wafer lot is qualified at 50 krad (Si) total dose as per ESCC 22900 specification at 210 rad/hour. The HC/HCT series is characterized under heavy Ion on 4 functions representative of the whole series and qualified as per the results of this characterization. Detailed results are provided in the table below: Table 6. Radiation data Function Result Gate: 54HC08 SEL and SEU free for LET [ 111 MeV/mg/cm² Multiplexer 54HC157 SEL and SEU free for LET[ 111 MeV/mg/cm² Flip-flop 54HC273 SEL free for LET [ 111 MeV/mg/cm² SEU: LETth = 16MeV/mg/cm², σsat = 1.7x10 -4 cm² Counter 54HC4040 SEL free for LET [ 111 MeV/mg/cm² SEU: LETth = 34MeV/mg/cm², σsat = 4.2x10 -4 cm² Analog Mux/Demux 54HC4053 SEL free for LET [ 111 MeV/mg/cm² SEU: LETth = 7MeV/mg/cm², σsat = 2.4x10 -4 cm²” |
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