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MPC5510 数据表(PDF) 21 Page - Freescale Semiconductor, Inc |
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MPC5510 数据表(HTML) 21 Page - Freescale Semiconductor, Inc |
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21 / 54 page ![]() Electrical Characteristics MPC5510 Microcontroller Family Data Sheet, Rev. 3 Freescale Semiconductor 21 2.2 Thermal Characteristics 2.2.1 General Notes for Specifications at Maximum Junction Temperature An estimation of the chip junction temperature, T J , can be obtained from the equation: TJ = TA + (RθJA × PD) Eqn. 1 where: TA = ambient temperature for the package ( oC) Eqn. 2 RθJA = junction to ambient thermal resistance ( oC/W) Eqn. 3 PD = power dissipation in the package (W) Eqn. 4 The supplied thermal resistances are provided based on JEDEC JESD51 series of standards to provide consistent values for estimations and comparisons. The difference between the values determined on the single-layer (1s) board and on the four-layer board with two signal layers and a power and a ground plane (2s2p) clearly demonstrate that the effective thermal resistance of Table 4. Thermal Characteristics Num Characteristic Symbol Unit Value 208 MAPBGA 176 LQFP 144 LQFP 1 Junction to Ambient 1, 2 Natural Convection (Single layer board) 1 Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. 2 Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal. RθJA °C/W 44 38 43 2 Junction to Ambient 1, 3 Natural Convection (Four layer board 2s2p) 3 Per JEDEC JESD51-6 with the board horizontal. RθJA °C/W 27 31 34 3 Junction to Ambient 1, 3 (@200 ft./min., Single layer board) RθJMA °C/W 35 30 34 4 Junction to Ambient 1, 3 (@200 ft./min., Four layer board 2s2p) RθJMA °C/W 24 25 28 5 Junction to Board 4 4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. RθJB °C/W 16 20 22 6 Junction to Case 5 5 Indicates the average thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1) with the cold plate temperature used for the case temperature. RθJC °C/W 8 6 7 7 Junction to Package Top 6 Natural Convection 6 Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. Ψ JT °C/W 2 2 2 |
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