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PCF8563TS/4 数据表(PDF) 36 Page - NXP Semiconductors |
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PCF8563TS/4 数据表(HTML) 36 Page - NXP Semiconductors |
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36 / 50 page ![]() PCF8563 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet Rev. 10 — 3 April 2012 36 of 50 NXP Semiconductors PCF8563 Real-time clock/calendar 14. Application information 14.1 Quartz frequency adjustment 14.1.1 Method 1: fixed OSCI capacitor By evaluating the average capacitance necessary for the application layout, a fixed capacitor can be used. The frequency is best measured via the 32.768 kHz signal available after power-on at pin CLKOUT. The frequency tolerance depends on the quartz crystal tolerance, the capacitor tolerance and the device-to-device tolerance (on average 5 ppm). Average deviations of 5 minutes per year can be easily achieved. 14.1.2 Method 2: OSCI trimmer Using the 32.768 kHz signal available after power-on at pin CLKOUT, fast setting of a trimmer is possible. 14.1.3 Method 3: OSCO output Direct measurement of OSCO out (accounting for test probe capacitance). Fig 29. Application diagram mgm665 SCL SDA VSS OSCI OSCO CLOCK CALENDAR PCF8563 SDA SCL MASTER TRANSMITTER/ RECEIVER VDD VDD SDA SCL RR VDD (I2C-bus) R: pull-up resistor R = 1 F tr Cb 100 nF |
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