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ADP1196ACBZ-R7 数据表(PDF) 9 Page - Analog Devices |
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ADP1196ACBZ-R7 数据表(HTML) 9 Page - Analog Devices |
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9 / 12 page ![]() Data Sheet ADP1196 Rev. 0 | Page 9 of 12 THEORY OF OPERATION Figure 21. Functional Block Diagram The ADP1196 is a high-side or low-side N-channel metal oxide semiconductor (NMOS) load switch that is controlled by an internal charge pump. The ADP1196 operates with voltages from 1.83 V to 5.5 V on either VIN or VB_EN. Internal circuitry monitors the VIN and VB_EN pins, connecting the internal power supply to the higher of the two voltages. This operation allows the NMOS load switch to operate on the low side of a particular load. An internal charge pump biases the NMOS switch to achieve a relatively constant, ultralow on resistance of 10 mΩ across the entire supply range. The use of the internal charge pump also allows for controlled turn-on times. Turning the NMOS switch on and off is controlled by the enable input, VB_EN, which can interface directly with 1.83 V logic signals when VIN is greater than 1.8 V. The ADP1196 supports 3 A of continuous current as long as TA is less than or equal to 70°C. At 85°C, the derated load current falls to ±2.22 A. Overcurrent protection limits the output current to 4 A. The overtemperature protection circuit is activated if the load current causes the junction temperature to exceed 125°C. When this occurs, the overtemperature protection circuitry disables the output until the junction temperature falls below approximately 110°C, at which point the output is reenabled. If the fault condition persists, the output cycles off and on until the fault is removed. ESD protection structures are shown in the block diagram as Zener diodes (see Figure 21). The ADP1196 is a low quiescent current device with a nominal 4 MΩ pull-down resistor on its enable pin (VB_EN). The package is a space-saving 1.0 mm × 1.5 mm, 6-ball WLCSP. VOUT VIN VOUT VIN GND VB_EN CHARGE PUMP, OVERCURRENT, AND SLEW RATE CONTROL OVERTEMPERATURE PROTECTION SUPPLY SWITCH ENABLE LOGIC |
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