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STM8AF528A 数据表(PDF) 69 Page - STMicroelectronics |
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STM8AF528A 数据表(HTML) 69 Page - STMicroelectronics |
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69 / 110 page ![]() STM8AF52/62xx, STM8AF51/61xx Electrical characteristics Doc ID 14395 Rev 9 69/110 10.3.5 Memory characteristics Flash program memory/data EEPROM memory General conditions: TA = -40 °C to 150 °C. Table 37. Flash program memory/data EEPROM memory Symbol Parameter Conditions Min(1) 1. Guaranteed by characterization, not tested in production. Typ Max Unit VDD Operating voltage (all modes, execution/write/erase) fCPU is 16 to 24 MHz with 1 ws fCPU is 0 to 16 MHz with 0 ws 3.0 — 5.5 V VDD Operating voltage (code execution) fCPU is 16 to 24 MHz with 1 ws fCPU is 0 to 16 MHz with 0 ws 2.6 — 5.5 tprog Standard programming time (including erase) for byte/word/block (1 byte/4 bytes/128 bytes) —— 6 6.6 ms Fast programming time for 1 block (128 bytes) —— 3 3.3 terase Erase time for 1 block (128 bytes) — — 3 3.3 ms Table 38. Flash program memory Symbol Parameter Condition Min Max Unit TWE Temperature for writing and erasing — -40 150 °C NWE Flash program memory endurance (erase/write cycles)(1) 1. The physical granularity of the memory is four bytes, so cycling is performed on four bytes even when a write/erase operation addresses a single byte. TA = 25 °C 1000 — cycles tRET Data retention time TA = 25 °C 40 — years TA = 55 °C 20 — |
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