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M95080-R 数据表(PDF) 31 Page - STMicroelectronics |
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M95080-R 数据表(HTML) 31 Page - STMicroelectronics |
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31 / 42 page ![]() M95080 M95080-W M95080-R DC and AC parameters Doc ID 022540 Rev 1 31/42 Table 16. AC characteristics (M95080-W, device grade 6) Test conditions specified in Table 9 and Table 11 Symbol Alt. Parameter Min. Max. Unit fC fSCK Clock frequency D.C. 10 MHz tSLCH tCSS1 S active setup time 30 ns tSHCH tCSS2 S not active setup time 30 ns tSHSL tCS S deselect time 40 ns tCHSH tCSH S active hold time 30 ns tCHSL S not active hold time 30 ns tCH (1) 1. tCH + tCL must never be lower than the shortest possible clock period, 1/fC(max). tCLH Clock high time 40 ns tCL (1) tCLL Clock low time 40 ns tCLCH (2) 2. Characterized only, not tested in production. tRC Clock rise time 2 µs tCHCL (2) tFC Clock fall time 2 µs tDVCH tDSU Data in setup time 10 ns tCHDX tDH Data in hold time 10 ns tHHCH Clock low hold time after HOLD not active 30 ns tHLCH Clock low hold time after HOLD active 30 ns tCLHL Clock low set-up time before HOLD active 0 ns tCLHH Clock low set-up time before HOLD not active 0ns tSHQZ (2) tDIS Output disable time 40 ns tCLQV tV Clock low to output valid 40 ns tCLQX tHO Output hold time 0 ns tQLQH (2) tRO Output rise time 40 ns tQHQL (2) tFO Output fall time 40 ns tHHQV tLZ HOLD high to output valid 40 ns tHLQZ (2) tHZ HOLD low to output high-Z 40 ns tW tWC Write time 5 ms |
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